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CFP: CALL FOR PAPERS. Special Issue: Operational Control of Wafer Production. Production Planning & Control International Journal
CALL FOR PAPERS
Special Issue: Operational Control of Wafer Production Production Planning & Control The Production Planning & Control: The Management of Operations international journal plans to publish a special issue on Operational Control of Wafer Production. Semiconductors have made their way into mostly all aspects of everyone's daily life. From spacecrafts to portable multimedia devices, semiconductors have transformed the world considerably since the invention of the transistor back in 1948. This reflects on the enormous importance of the semiconductor sector whose sales are expected at the level of more than 214 billion american dollars in year 2004. A growth of arround 28.6% with regards year 2003 (Semiconductor Industry Association, http://www.sia-online.org). Manufacturing of semiconductors starts with the production of wafers which are mainly made from silicon substrates. The production of VLSI products and more specifically, processor chips, greatly depend on the chemical purity and near-perfect crystalline properties of wafers. Therefore, the production of silicon wafers has achieved a high degree of intricacy with many complex phases like raw material refining, silicon ingot growing, peripheral grinding, ingot slicing into wafers, wafer beveling, lapping and etching, heat treatment, polishing, ultra-pure water cleaning and finally, inspection, packaging and shipping. The margins of chip manufacturing companies greatly depend on yields which are a function of the semiconductor die geometry, size and also of the wafer diameter and purity. Defects on wafers translate into lower yields of the final chips and thus the importance of an accurate control in the wafer production. This special issue will give the opportunity of putting together high-quality papers in the area of production control with special emphasis on wafer production. Examples of the subject matter of the papers include, but are not limited to, the following: - Comprehensive reviews and surveys that give an integrated view of the past and present contributions in the operational control aspects of wafer production with insight on the future research needs. - Development of appropriate tools and techniques for solving various arising the planning, scheduling and control of wafer production. - Application papers (i.e., actual or potential applications of various operational control techniques to wafer production as a whole or to any of its phases). - Description and evaluation of software packages available to solve operational control problems in wafer production. All manuscripts will be promptly and carefully referred to be published in late 2005 or early 2006. Authors should adhere to Instructions for Authors for the Production Planning & Control journal available at the url http://www.tandf.co.uk/journals/authors/tppcauth.asp when preparing their manuscripts that should be submitted electronically in PS, PDF or DOC formats to one of the following guest editors of this special issue no later than January 20, 2005: Dr. Jatinder N. D. Gupta College of Administrative Science University of Alabama in Huntsville Hunstville, Al 35899, USA Tel: (256)-824-6593 e-mail: Dr. Ruben Ruiz Garcia Depart. de Estadistica e Investigacion Operativa Aplicadas y Calidad Universidad Politecnica de Valencia Camino de Vera s/n (Edificio I-3) Valencia, 46021, Spain Tel: (+34)-96-387-70-07, 74946 e-mail: |
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